• ADP5052ACPZ-R7,ADP5052ACPZ-R7,OTOMO
  • ADP5052ACPZ-R7,ADP5052ACPZ-R7,OTOMO

ADP5052ACPZ-R7

ADP5052ACPZ-R7 is a highly integrated quad-output PMIC from Analog Devices, featuring dual high-current synchronous bucks (3 A + 2 A), dual low-noise LDOs (300 mA each), fully programmable I²C control, and hardware-enforced power sequencing — all in a compact 7 mm × 7 mm LFCSP package. Designed for FPGA, ASIC, and AI processor power delivery, it delivers precision, flexibility, and reliability in demanding industrial, medical, and communications applications.
  • ADP5052ACPZ-R7,ADP5052ACPZ-R7,OTOMO

Description

ADP5052ACPZ-R7 is a high-performance, quad-output power management IC (PMIC) designed and manufactured by Analog Devices Inc. (ADI). It integrates two synchronous step-down (buck) regulators and two low-dropout linear regulators (LDOs) into a single, compact 40-lead LFCSP package (7 mm × 7 mm) with exposed thermal pad, optimized for space-constrained, multi-rail applications in FPGA, ASIC, DSP, and microprocessor-based systems. The “ACPZ” suffix denotes the RoHS-compliant, halogen-free, 40-lead Lead Frame Chip-Scale Package (LFCSP); the “-R7” indicates 7-inch tape-and-reel packaging (1,000 units per reel) — standard for high-volume automated assembly.

Introduction

The ADP5052ACPZ-R7 is engineered to simplify complex power sequencing and deliver clean, efficient, and tightly regulated supplies for advanced digital SoCs requiring multiple voltage domains:
🔹 Buck Regulator 1 (BUCK1): Up to 3 A output, 2.75 V to 5.5 V input, adjustable output from 0.6 V to VIN – 0.1 V;
🔹 Buck Regulator 2 (BUCK2): Up to 2 A output, same input range, adjustable 0.6 V to VIN – 0.1 V;
🔹 LDO 1 (LDO1): 300 mA, low-noise (15 µVRMS), high PSRR (> 70 dB @ 1 kHz), output from 0.8 V to 3.3 V;
🔹 LDO 2 (LDO2): 300 mA, identical performance to LDO1.
All four regulators are independently programmable via I²C-compatible serial interface (up to 400 kHz), enabling dynamic voltage scaling (DVS), real-time margining, and adaptive power control — critical for optimizing performance vs. power in battery-powered or thermally limited systems. Crucially, the ADP5052 includes an integrated power sequencer with configurable startup/shutdown order, programmable delays (0–255 ms), and fault-handling logic (e.g., halt-on-failure, auto-retry), eliminating the need for external sequencing ICs or complex GPIO-based timing.
The device supports advanced power-saving features, including:
  • Ultralow quiescent current: < 30 µA in full shutdown mode (all rails off);
  • Power-save mode (PSM) in buck regulators for high efficiency at light loads (< 10 mA);
  • Forced PWM mode for fixed-frequency, low-noise operation during sensitive analog phases (e.g., ADC sampling).
The ACPZ package (40-lead LFCSP, 7 mm × 7 mm) features a large exposed thermal pad (EP) that — when properly soldered to a multilayer PCB ground plane — achieves θJA ≈ 22°C/W, enabling full 3 A/2 A simultaneous operation at ambient temperatures up to +85°C without external heatsinking.

Key Features

✅ Integrated Quad-Output Power Solution:
 • Two high-efficiency synchronous buck regulators (3 A + 2 A);
 • Two low-noise, high-PSRR LDOs (300 mA each);
 • All outputs independently controllable and monitorable via I²C.
✅ Precision Regulation & Dynamic Control:
 • Buck output accuracy: ±0.8% (0.6 V reference, –40°C to +125°C);
 • LDO output accuracy: ±1.5% (over line/load/temp);
 • I²C interface supports readback of output voltages, currents (via internal sense), temperature, and fault status — enabling closed-loop system health monitoring.
✅ Intelligent Power Sequencing:
 • Fully configurable startup/shutdown order (8 possible sequences);
 • Programmable delay steps (0–255 ms, 1 ms resolution);
 • Fault response options: halt-on-failure, auto-retry, or continue-on-failure — essential for FPGA configuration and safety-critical boot.
✅ High Efficiency & Low Noise:
 • Buck efficiency > 95% (e.g., 5 V → 1.2 V @ 2 A);
 • LDO PSRR > 70 dB @ 1 kHz, > 40 dB @ 100 kHz — ideal for noise-sensitive analog/RF rails (e.g., PLL, ADC, SerDes);
 • Integrated soft-start and slew-rate control prevent output overshoot and inrush stress.
✅ Robust Protection & Diagnostics:
 • Overcurrent protection (OCP) with hiccup-mode recovery on all bucks;
 • Thermal shutdown with 15°C hysteresis;
 • Undervoltage lockout (UVLO) on main input (AVIN);
 • Comprehensive fault reporting via I²C (OCP, OTP, UVLO, LDO dropout).
✅ Thermally Optimized LFCSP-40 (ACPZ):
 • 7 mm × 7 mm footprint with 3.2 mm² exposed copper pad;
 • Supports continuous full-load operation at +85°C ambient — verified with ≥ 400 mm² EP copper area and 20+ thermal vias.

Typical Specification Table

Parameter Specification
Manufacturer Analog Devices Inc. (ADI)
Product Series ADP505x Family (Quad-Output PMICs for FPGA/ASIC)
Model ADP5052ACPZ-R7
Function Dual Buck + Dual LDO Power Management IC
Buck 1 Output Current Up to 3 A
Buck 2 Output Current Up to 2 A
LDO 1 & 2 Output Current 300 mA each
Input Voltage Range (AVIN) 2.75 V to 5.5 V
Buck Output Range 0.6 V to AVIN – 0.1 V (adjustable)
LDO Output Range 0.8 V to 3.3 V (adjustable)
Output Accuracy (Buck) ±0.8% (over line, load, temp: –40°C to +125°C)
Output Accuracy (LDO) ±1.5%
Control Interface I²C-compatible (up to 400 kHz), addressable (4 options)
Sequencing Capability Configurable order/delays/fault response
Quiescent Current (Shutdown) < 30 µA
Operating Temperature –40°C to +125°C (junction)
Package 40-Lead LFCSP with Exposed Pad (ACPZ)
RoHS / Green Yes (Pb-free, Halogen-free)
Packaging 7-inch Reel, 1,000 units (R7)

Typical Applications

🔹 FPGA & SoC Power Supplies: Single-chip solution for core (VCCINT), auxiliary (VCCAUX), memory (VDDIO), and analog (AVDD) rails — with precise sequencing required for Xilinx/Intel/AMD device configuration and reliability.
🔹 High-Performance DSP & GPU Modules: Dynamic voltage scaling for compute-intensive workloads (e.g., lowering core voltage during idle, boosting during inference) — enabled by real-time I²C control and margining.
🔹 Medical Imaging Systems: Clean, low-noise analog supplies for high-speed ADCs, RF front-ends, and ultrasound beamformers — leveraging LDOs’ high PSRR and buck/LDO integration for compactness.
🔹 Industrial Edge AI Processors: Powering vision AI SoCs (e.g., NVIDIA Jetson, Qualcomm QCS) with thermal-aware throttling — using on-chip temperature readback and I²C-triggered voltage reduction.
🔹 5G Small Cell Baseband Units: Multi-rail supply for FPGA, RFIC, and data converters — where sequencing integrity, EMI control (via forced PWM mode), and small size are critical.
🔹 Portable Test & Measurement Equipment: Battery-powered handheld scopes, spectrum analyzers, and signal generators — benefiting from ultralow shutdown IQ and integrated sequencing for fast wake-up.

Development & Design Notes

🔧 PCB Layout & Thermal Design:
  • Solder the large exposed pad (EP) to a ≥ 400 mm² internal ground plane using ≥ 20 thermal vias (0.3 mm diameter). For continuous 3 A + 2 A operation, add a 2-layer thermal relief under the EP and avoid placing heat-generating components above the IC.
  • Keep buck power loops (AVIN → HS-FET → SW → INDUCTOR → VOUT → GND) extremely short and use wide copper pours — minimize EMI and switching losses. Route LDO input/output traces directly adjacent to reduce impedance.
🔧 I²C Interface & System Integration:
  • Use 4.7 kΩ pull-up resistors on SDA/SCL (to 3.3 V) — ensure rise time < 300 ns for 400 kHz operation. Add 100 pF capacitor from SDA/SCL to GND if routing near noisy digital signals.
  • Leverage I²C readback registers (READ_VOUT, READ_IOUT, READ_TEMPERATURE) for runtime health checks — implement watchdog timeout on I²C comms to force hard reset if communication stalls.
🔧 Sequencing Configuration:
  • Configure sequence via I²C registers SEQ0SEQ3: define rail enable order (e.g., LDO1 → BUCK1 → BUCK2 → LDO2), inter-rail delays (e.g., 10 ms between core and I/O rails), and fault behavior (e.g., halt on BUCK1 OCP).
  • Store configuration in nonvolatile EEPROM (external) or reprogram at boot — ADP5052 has no internal NVM, so sequencing must be initialized by host firmware.
🔧 Noise & EMI Mitigation:
  • Enable Forced PWM Mode on bucks during analog capture phases (e.g., ADC sampling window) to eliminate frequency modulation artifacts — set PWM_EN bit in MODE register.
  • Place 10 µF ceramic + 100 nF ceramic capacitors within 2 mm of each VOUT pin; use separate input caps (22 µF × 2) for each buck to prevent cross-talk.
🔧 Reliability & Functional Safety:
  • For IEC 61508 SIL-2 compliance, combine ADP5052’s built-in diagnostics (OTP, OCP, UVLO flags) with external watchdog supervision of I²C activity and PGOOD signals.
  • ADI provides FMEDA report, safety manual, and failure rate data (FIT = 12) — simplifies safety case development for end equipment.
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